NEW YORK—The European Telecommunications Standards Institute held its first smart card interoperability event in mid-December at its headquarters in Sophia Antipolis, France, bringing together 35 industry experts to address three crucial areas.
The Third Generation Partnership Project Smart Card Interoperability meeting, organized by ETSI’s PLUGTESTS Service, focused on interoperability of Subscriber Identity Module Toolkit features, between SIM Java cards and on 3G Universal Subscriber Identity Module cards.
Further information can be obtained at www.etsi.org/plugtests